HP8000E Colorimetric & Electrical Test System for LED Chips
Home > Products > LED Test MeasurementMeasures:
Forward voltage, reverse current, dominant wavelength, peak wavelength, half-bandwidth, spectral purity, correlated color temperature, color rendering index, chromaticity coordinates, maximal & dynamic & normal luminous intensity, half-intensity angle, spread angle of light beam.
Features:
* Adjustable X and Y axis controlled movement mechanism
* Adjust X Y axis with microscope to aim at electrification input position of chips expediently.
* Floating electronic probes are satisfied to light the different sizes of LED chips
* Has the ability to dynamically display the practical measurement results
* Luminous intensity measurement meets CIE Pub.No.127 Condition A
* Value monitor for PASS / FAIL testing
* Friendly graphic user interface provides an easy-to-use operation environment
* Be used in quality management and analysis
* Meets CIE 127 and CIE 84 measurement requirements
Specifications:
* Forward Current IF: 0.1mA ~ 800.0mA (±0.5%)
* Reverse Current IR: 0.1μA ~ 200.0μA (±1%)
* Forward Voltage VF: 0.1V ~ 20.0V
* Spectral Range: 380nm ~ 780nm
* Spectral Resolution: ±0.2nm
* Reproducibility: ±0.5nm
* Accuracy of Chromaticity Coordinate (Δx, Δy): ±0.003
* Correlated Color Temperature CCT: 1500K ~ 25000K (±3%)
* Control Range of Adjustable movement mechanism: 75mm * 75mm



